The integrated feature of memory, storage and computing of memristors can achieve an integrated system of large-capacity storage and in-situ efficient computing, which is an effective way to solve the "memory wall" problem of the traditional von Neumann architecture. Due to the existence of non-ideal factors of devices and arrays, the existing integrated storage and computing systems are confronted with comprehensive reliability problems such as inaccurate storage and computing operations, short system service life and low fault handling efficiency. This report first introduces the application-specific application-oriented domain-specific architecture design method, and then extends to the mathematical modeling and theoretical compensation derivation of non-ideal factor problems, thereby constructing a highly reliable domain-specific architecture.